Publications
Manuscripts Under Review / Preparation
DebugML: A Debugging Framework for ML Pipelines
Sunny Shree , Yu Lei, D. Richard Kuhn, and Raghu Kacker.
Under Review.Data Debugging: Resolving Misclassifications in Machine Learning Models
Sunny Shree , Yu Lei, D. Richard Kuhn, and Raghu Kacker.
Under Review.Effect Of Model Compression on Influence Analysis
Sunny Shree , Yu Lei, D. Richard Kuhn, and Raghu Kacker.
Under Preparation.
2025
- Fairness Testing of Machine Learning Models Using Combinatorial Testing in Latent Space
Arjun Dahal, Sunny Shree , Yu Lei, Raghu Kacker, and D. Richard Kuhn. In 2025 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW), IEEE – Article.
2024
Leveraging Software Testing Techniques to Explain, Analyze, and Debug Machine Learning Models
Sunny Shree.
Computer Science and Engineering Dissertations. 400. MavMatrix – Article.Constructing Surrogate Models in Machine Learning Using Combinatorial Testing and Active Learning
Sunny Shree , Krishna Khadka, Yu Lei, D. Richard Kuhn, and Raghu Kacker.
In Proceedings of the 39th IEEE/ACM International Conference on Automated Software Engineering (ASE ‘24). Association for Computing Machinery, New York, NY, USA, 1645–1654. IEEE/ACM – Article.Proxima: A Proxy Model Based Approach To Influence Analysis
Sunny Shree , Jaganmohan Chandrasekaran, Yu Lei, D. Richard Kuhn, and Raghu Kacker.
In 2024 IEEE International Conference On Artificial Intelligence Testing (AITest), IEEE – Article.Assessing the Degree of Feature Interactions that Determine a Model Prediction
Krishna Khadka, Sunny Shree , Yu Lei, Raghu Kacker, and D. Richard Kuhn. In 2024 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW), IEEE – Article).
2022
- DeltaExplainer: A Software Debugging Approach to Generating Counterfactual Explanations
Sunny Shree , Jaganmohan Chandrasekaran, Yu Lei, D. Richard Kuhn, and Raghu Kacker.
In 2022 IEEE International Conference On Artificial Intelligence Testing (AITest), IEEE – Article.